Using imaging systems for display measurement and correction has been proven to ensure the visual performance of emissive displays for low-cost, high-yield production. As display resolution increases, however, an imaging system’s ability to capture display pixels with sufficient resolution for measurement accuracy—while measuring all pixels in a single image for efficiency—is
reduced.
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An imaging system with microscope lens may be able to achieve as many as 30x30 sensor pixels to measure each display pixel (left); however, imaging systems achieve much lower resolution per pixel when measuring an entire display in a single image, as in this example of 3x3 sensor pixels per display pixel (right).
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MicroLEDs dramatically increase the number of pixels per display, reaching resolutions far beyond standard imaging systems. This requires increasingly precise imaging methods to ensure accurate measurement of luminance and color at each subpixel for effective correction processes.
Read a White Paper to Learn:
- Considerations for choosing a microLED measurement system
- Methods to optimize the accuracy of standard-resolution imaging systems for subpixel measurement without sacrificing speed
- Studies comparing measurement systems and image analysis functions
- Benefits demonstrated through data and real-world applications
