The visual quality of a microLED display is determined by the performance of every individual subpixel (LED), but these emitters often vary in luminance and color. Poorly performing subpixels appear at multiple stages of the fabrication process—epitaxy, LED chip process, or mass transfer—thus a series of quality checks are required along the way, in addition to inspection at the
final assembly stage.
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First image: A microLED display with subpixel variation. Second image: The same display after measurement and correction using Radiant's demura method.
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The Solution: Subpixel Measurement and Correction
Radiant Vision Systems provides measurement and inspection solutions for microLEDs that ensure quality from the chip/wafer level to the panel/assembly level. Radiant’s ProMetric® Imaging Photometers and
Colorimeters measure light and color of every subpixel with precision. Using an optional Microscope Lens, subpixels can be measured in extreme detail, as shown in the image below.
Once microLEDs are transferred to the backplane, Radiant’s measurement systems can be used to evaluate luminance and color across the entire panel to measure uniformity and mura. Radiant’s "demura" method can also be applied to correct pixel and subpixel output and increase microLED yields.
A ProMetric imaging system and Microscope Lens are used to characterize subpixel layouts, shapes, and color patterns, achieving extreme detail for subpixel characterization and analysis.
